This course provides multiple lectures coupled with laboratory sessions each week. Both the lecture and the laboratory provide an introduction to chemical, morphological, mechanical and characterization technique coupled to the fundamentals of materials theory. Techniques to be covered include but not limited to X-ray diffraction, electron, scanning probe and atom probe microscopy. The course puts a major emphasis on data acquisition and processing methods associated with characterization techniques and the use of data analytical tools to aid in its interpretation. Students are also trained in coupling the scientific principles of materials characterization to different materials synthesis methods involving bulk, thin films and nanostructured materials.